The Detector Spectral Response Workstation from Optronic Laboratories, Inc. is designed for traceable characterization of a broad range of optical sensors, solar cells, and scientific-grade cameras. Turnkey and modular, it is configurable to measure from 200 nm to 30 µm wavelengths. By adding appropriate UV, VIS, and/or IR source modules, along with imaging or collimating collection exit optics, the OL 750 Workstation provides exceptionally stable illumination and collection performance to determine the precise optical power response, irradiance response, or quantum efficiency of your test devices.
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