We offer configurations of the OL 750 System to operate at wavelengths from 200 nm to 30 um.  The system is modular, allowing the user to reconfigure the core Spectroradiometer with an unmatched range of accessories to meet diverse measurement requirements. This flexible tool system can be set up to measure optical properties of devises and materials in terms of Source Spectral Analysis, Detector Spectral Response, Total Spectral Flux, Specular Spectral Reflectance, Diffuse spectral Reflectance, and Spectral Transmittance.