The OL 750: Your Must-Have System for Measurement of Material Reflectance Properties

Characterizing the specular spectral reflectance properties of materials is critical in applications such as optical coatings, mirrors, luminaires, automotive windshields, and computer monitor and TV screens. When configured with the OL 750-75MA Goniospectroreflectance Attachment, the OL 750 workstation can provide accurate and precise critical measurements as a function of both wavelength and angle of incidence. Highly-intuitive Windows-based software combines utility programs and data reduction routines with specific application software for a completely integrated operating system. Best of all, the OL 750’s extensive accessories catalog means it can grow and evolve as your needs change.

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